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Mini-Z Zr
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X-ray fluorescence technology provides one of the simplest, most accurate and most economic analytical methods for the determination of the chemical composition of many types of materials. It is non-destructive and reliable, requires no, or very little, sample preparation and is suitable for solid, liquid and powdered samples. It can be used for a wide range of elements, from beryllium (4) to uranium (92), and provides detection limits at the ppm level; it can also precisely measure concentrations of up to 100%.
 
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Mini-Z Zr
Mini-Z
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Mini-Z

Mini-Z Zr benchtop WDXRF analyzer

A Rigaku green solutionRigaku has developed a new specialized analyzer that is optimized for the determination of zirconium coating thickness on aluminum.

Using wavelength dispersive X-ray fluorescence (WDXRF) spectrometry, the Rigaku Mini-Z Zr can analyze zirconium coating weights in the range from 0.4 to 30 mg/m2 with just a 100-second measurement. 

Measurements are non-destructive and do not require any tedious or time-consuming sample preparation, such as cutting out coupons or reshaping. The sample chamber is configurable to accept various size (diameter) cans. 

The instrument is designed for routine walk-up, at-line use by production personnel. Built-in computer, display and membrane keypad simplify operation and deliver the ruggedness required for 24/7 plant operation. 

Features

  • Optimization for low coating weight Zr analysis
  • Easy-to-operate for non-technical personnel
  • Compact benchtop design for at-line use
  • No external computer needed
  • Exceptional repeatability at low coating weights
  • Wide analysis range
  • WDXRF design eliminates interference problems

Application notes

  • Mini-Z Zr for conversion coatings (request a copy)
  • High performance measurement of zirconium coating thickness on aluminum beverage cans (request a copy)