Geological analysis by XRF
In studying the planetary processes and makeup of the Earth (geology), geologists have a need to analyze the composition of rock and mineral samples. That these analyses can be accomplished, through the use of X-ray fluorescence (XRF) instrumentation, without destruction or alteration of the sample, has made the technique of particular interest to the geological community. Rigaku's technology and know-how provide a number of unique solutions for these determinations:
- Elemental/phase mapping of surfaces
- Inclusion analysis
- Inverted or standard optics depending on application
- Small sample analysis
- Ease-of use for teaching
- Rapid, flexible semi-quant (FP) analysis
Please contact Rigaku to request a copy of the available application note about geological analysis.
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