SmartLab^®: Advanced high resolution measurements with simple operation

The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.

Winner of the 2006 R&D 100 Award for technical innovation, the SmartLab is design for completely automated analysis of thin films and other advanced materials.  Powered by Guidance, Rigaku's revolutionary knowledge based software package, SmartLab uses fully deveopled measurement packages for completely automated measurement of thin films, nanomaterials, powders, and liquids. Measurement packages exist for powder diffraction, glancing incidence diffraction, in-plane diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS) measurements.

Features

• θ/θ design for horizontal sample mounting
• Closed loop drive system for high resolution scanning
• Optional 9.0 kW rotating anode generator
• Fully automatic system alignment
• Guidance software based automated measurement
• 300 mm wafer handling
• CBO for focusing and parallel beam geometries without reconfiguration
• In-plane diffraction arm for in-plane measurements without reconfiguration
• High resolution optics
• SAXS capabilities