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Powder and thin film XRD applications

• RAPID II
  • Microdiffraction
  • X-ray microdiffraction for residual stress determination
  • Percent crystallinity of polymers
  • Texture strength representation as fiber texture plots
  • X-ray microdiffraction of the crystalline structure forming a tooth
  • Compression studies on wood
  • Comparing cellulose in Sitka spruce and in celery
  • Solution structures and precrystallisation molecular association
  • Crystallization of a rubber band by stretching
  • Ununiform crystalline state of a PET bottle
• MiniFlex™ II
  • Duct tape specimens
  • Non-destructive failure analysis
  • Validating minting ages of coins
  • RIR-based quantitative phase analysis of crystal polymorphism
  • General XRD phase/composition identification analysis
  • Forensic analysis by X-ray diffraction
  • Fast phase analysis of mineral powders
  • XRD characterization of refractory powders by Search/Match analysis
  • Quantification of the alpha-to-beta brass ratio in wire coatings
  • What's in your pastry?
  • Phase identification in the oil drilling industry
  • Zeolite—Impurities and Phase Identification
  • Composition of barite: A universal material
  • Scales in the petroleum industry: Phase identification
  • Chocolate or cocoa? X-ray diffraction: General comparisons
  • Retained austenite analysis
  • Chocolate: Phase ID
  • Quantification of Zeolite phases
  • Phase identification of a forensic sample
  • Quality control in industrial processes with phase identification
  • What do greenhouse gases, pearls, antacids, lasers, cement and sea shells have in common?
  • Forensic vehicle identification from paint samples
  • Talc? I don't think so...Whole Pattern Fitting
  • Bringing XRD experiments into the teaching laboratory
  • X-ray diffraction of an over-the-counter pain medication
  • Shale vs. slate XRD identification—know your slate or pay dearly
  • Respirable silica (alpha quartz) measurements
  • Identifying very small amounts of (geo)material
  • Non-destructive fossil identification of ammonites
  • Contamination makes aluminum oxide a priceless gem
  • Pancakes
  • Identification of an unknown sludge
  • Phase Identification of common minerals in natural facial cosmetics
  • Quantitative Analysis of Anhydrite
• SmartLab^®
  • Textured thin films
  • Small angle X-ray scattering (SAXS) in the study of Aerogel particles
  • High-resolution X-ray reciprocal space mapping of epitaxial nanostructures
  • X-ray reflectivity analysis of thin films

  • Composition and thickness of epitaxial alloy films

  • Residual stress and texture mapping of friction stir welds

  • Triple-axis X-ray diffraction of SiC thin films on Si (001)

  • Variable-resolution X-ray reflectivity analysis of AlN thin films on sapphire substrate

  • A joint X-ray reflectivity (XRR) and grazing-incidence small-angle scattering (GISAXS) analysis of a platinum nanoparticulate film

  • Grazing-incidence small angle X-ray scattering (GISAXS) analysis of pore size distributions in nano-porous silica films

  • Evaluation of molecular orientation of Cu phthalocyanine thin film on rubbing-processed glass substrates

  • Grazing-incidence X-ray diffraction of iridium thin films on Si

  • High-speed identification and quantification of Hematite and Magnetite

  • Simultaneous analysis of film thickness, density and surface roughness

  • Evaluation of ZnO nanocrystals

  • Evaluation of the crystallinity (tilt and twist distributions) of a GaN thin film by the X-ray rocking curve method

  • Diffraction measurement of a thin film pentacene for an organic TFT

  • Evaluation of a thin film by the X-ray reflectivity method

  • Measurement of the in-plane reciprocal lattice map of ultra-thin films of ZnO, MgO and sapphire

  • Observing the variation in the depth direction in InN, GaN and GaAs nondestructively

  • Evaluation of the next generation magnetic recording media (FePt) by in-plane X-ray diffraction

  • Evaluation of the crystal structure of a DVD recording layer

  • Evaluation of a cobalt magnetic thin film on a hard disk

  • Evaluation of a low dielectric constant (Low-k) insulation thin film between layers using grazing incidence X-ray scattering

  • Al-based alloys prepared at different conditions: using an XY stage as an automatic sample changer

  • Evaluation of the structure of a high-k gate insulation thin film

  • Preferred orientation of carbon nanotubes in polyethylene

  • Quantitative X-ray analysis of Gd powders in air

  • Combined XRD and SAXS analysis of nano-magnetic materials

  • High-resolution X-ray rocking curve analysis of an SiGe film grown on an Si (001) substrate

  • Texture of MgO single crystal substrate material

  • Texture analysis of NiW alloy

  • Characterization of an InN epitaxial film on a sapphire substrate by X-ray reciprocal space maping (RSM) and rocking curve (RC) analysis

  • Determination of the layer thickness and roughness of polymer films by X-ray reflectivity

  • Evaluation of SrTiO₃ single crystal substrate by high-resolution X-ray reciprocal space mapping

  • High-resolution X-ray reciprocal space mapping of AlN epifilms on sapphire

• TTRAX III 

  • Non-destructive evaluation of pseudo-polymorphic impurities in a drug tablet

• Ultima IV 
  • Rietveld refinement for a cement sample
  • Contact printed Co/insulator/Co molecular junctions
  • Small angle X-ray scattering of nanomaterials
  • Small angle X-ray scattering (SAXS) measurements of nanomaterials
  • In-situ analysis
  • Analysis of thin film materials
  • On-demand in-plane scanning for thin film analysis
  • High-intensity, high-resolution measurements of well powdered samples
  • High-resolution stress and texture measurements
  • Small area mapping of a fracture on a TiN material
  • Grazing Incidence X-ray Diffraction (GIXRD) analysis of thin film material
  • In-situ high temperature studies of a negative thermal expansion coefficient material, ZrW₂O₈
  • Rietveld refinement of geological material: pushing the envelope
  • The effects of temperature and atmosphere on the aggregation of platinum nanoparticles
  • Detailed observation of crystal phase transition of fats occurring over a narrow temperature range
  • Fast, nondestructive measurement of polymorphic impurities in medicinal tablets
  • Size distribution of CdSe nanoparticles
  • Particle size distribution of Cu nanoparticles in polyimide film
  • Where is chrysotile (asbestos) in serpentine stone?
  • Analysis of glazing chemicals, paints and a vermilion ink in arts and crafts
  • Studying molecular arrays in a liquid crystal
  • Structural changes of a Whistler alloy due to heat treatment
  • Measuring trace amorphous components in a raw drug material
  • Reitveld refinements from an as-obtained rock chunk
  • Detection of low-level polymorphic impurities in pharmaceuticals
  • Grazing incident X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) studies of a Ni-Mn-Ga material
  • In-plane pole figures on a steel sample
  • Rietveld refinement of the doped lanthanum fluoride (EuLaF₃) lattice
  • Unit cell refinement of Montmorillonite clay using the Rietveld method
  • XRR studies on a cellulose film
  • Rietveld refinement of a sulfide corrosion powder
  • Rietveld refinement of an urban soil
  • Particle size distribution of Pd on silica
  • The composition of eggshell
  • Bentonite- A healing clay!
  • Small angle X-ray scattering analysis of carbon-supported Pt nanoparticles