RAPID II — the versatile X-ray diffraction system

Single crystal structure plus powder diffraction for phase i.d. / structure

A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku RAPID II is the latest member of the RAPID family of large area curved image plate (IP) detector-based X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallo­graphy to chemical crystallography. In addition to small molecule crystallography, other typical applications (depending on configuration) include: high-resolution charge density measurement, micro-diffraction, diffuse scattering, measurement of weakly diffracting disordered materials, wide angle X-ray scattering (WAXS), stress and texture measurements, and general purpose powder diffraction.

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Curved detector for maximum reciprocal space coverage

RAPID II is so versatile that it can replace several instruments without compromising data quality. Its unique, curved large-area detector subtends a 2θ range of 204° at a single detector setting for maximum reciprocal space coverage. The large curved active area is advantageous because a massive solid angle of data is collected in a single exposure. While the wide dynamic range eliminates worrying about detector saturation, the curved-plate geometry of the RAPID II reduces oblique-incidence X-ray absorption effects seen with flat detectors of any kind.

Powerful software suites to process X-ray diffraction data

CrystalClear™ is a data collection and analysis package designed for single crystal data. Based on Rigaku's easy-to-use flow bar user interface, CrystalClear walks the user through steps required to collect and prepare a data set for structure determination. Includes data collection, image display, indexing, space group determination, integration, scaling and absorption correction. Optional software packages include 2DP, 3D Explore and PDXL. 2DP is a general purpose 2D data processing software package offering 2D image processing and integration for powder and other polycrystalline materials. 3D Explore is a state-of-the-art display package for reciprocal space mapping and pole figure analysis. The PDXL powder diffraction suite offers modules for basic powder diffraction analysis, automated search match, Rietveld refinement, powder pattern simulations, crystallite size determination, and percent crystallinity.

RAPID II with FR-E+ SuperBright DW dual-wavelength source

Choice of X-ray sources, including dual wavelength

Inherent to the flexibility of this system is a choice of X-ray sources, ranging from: a high-frequency 3 kW sealed tube, to a MicroMax-003 microfocus seal tube, to a 1.2 kW MicroMax™-007 HF microfocus rotating anode. Available optics range from a traditional graphite monochromator or high-performance SHINE™ optic to a VariMax™ confocal X-ray optic. A new dual wavelength option is available with the new MicroMax-007 HF DW or FR-E+ SuperBright™ sources (shown at right). In a novel approach, two optics are housed in a single assembly, with either optic being selected by a simple rotation. In addition, the patented adjustable divergence feature is maintained for each optic.

RAPID II: an extraordinarily diverse X-ray diffraction platform