Small molecule crystallography
 
 
Small molecule crystallography
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Determination of the molecular structure of chemical compounds by X-ray diffraction (XRD) is the primary function of Rigaku small molecule crystal­lography systems. This method, also called X-ray crystal­lography, is the definitive technique for understanding the three-dimensional structure of chemical compounds: the compo­sition of atoms, their relative orienta­tion, and the chemical bonds between the atoms (both bond lengths and bond angles). This structural knowledge then pro­vides part of the basis for understanding and predicting the chemistry of the whole molecule, or one or more of its subcompo­nents (or functional groups).

X-ray crystallography is the study of crystal structures through X-ray diffraction tech­niques. When an X-ray beam bombards a crystalline lattice in a given orientation, the beam is scattered in a reproducable manner characterized by the atomic structure of the lattice. This diffraction phenomenon occurs when the wavelength of X-rays and the inter­atomic distances in the lattice are of a similar magnitude.

 
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Understanding Single Crystal X-ray Crystallography
by Dennis W. Bennett, Wiley-VCH, 2010
 ISBN:
978-3-527-32677-8

Small molecule / chemical crystallography

Three dimensional (3D) atomic structures of small molecules may be unambiguously determined by employing the technique of single crystal X-ray diffraction (SXRD). Such chemical compounds, which may be of either chemical or biological interest, include — but are not limited to — new synthetic chemicals, catalysts, pharmaceuticals, and natural products.

 

As a global leader in analytical X-ray technology, Rigaku is committed to helping solve your small molecule crystallographic problems. To that end, Rigaku offers four small molecule crystallography systems — combinations of area detector, goniometer, generator, optics, and software — to address particular needs in your lab, group or department.

Once a crystal of the compound under investigation has been grown, the complete diffraction pattern — which may consist of thousands of individual measurements — resulting from the interaction of an intense X-ray beam with the crystal is collected on a large area detector that can collect a vast number of observations in a single exposure. Automated structure solution is accomplished by analysis of the complex diffraction pattern. This same technique can also be used to produce detailed electron density maps of molecular bonds.