Elemental analysis
Non-destructive elemental analysis of boron (B) through uranium (U)
– in solids, liquids, powders and thin films – from sub-ppm levels to 100%:
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Simultaneous qualitative and quantitative analysis of Na to U. |
High-throughput elemental analysis with low detection limits for light elements. |
X-ray fluorescence technology provides one of the simplest, most accurate and
most economic analytical methods for the determination of the chemical
composition of many types of materials. The technique is generally
non-destructive, requiring little if any sample preparation, and is suitable for
almost all sample types. XRF can measure a wide range of elements, from
beryllium (5) to uranium (92), while providing sub-ppm detection limits.
Rigaku offers a complete range of XRF products, including bench-top energy
dispersive (EDXRF) and wavelength
dispersive (WDXRF) spectrometers, high-powered sequential (WDXRF)
spectrometers, high-throughput simultaneous WDXRF spectrometers and both
benchtop and high-powered total
reflection X-ray fluorescence (TXRF) for trace element analysis.
Typical uses include the analysis of petroleum oils and fuel, plastic, rubber and textiles, pharmaceutical products, foodstuffs, cosmetics and body care products, fertilizers, geological materials, mining feeds, slags and tails, cement, heat-resistant materials, glass, ceramics, catalysts, wafers; the determination of coatings on paper, film, polyester; metals and alloys, glass and plastic; forensics and pollution monitoring of solid waste, effluent, cleaning fluids, pools and filters.