EDXRF & XRT
 
Home > Products > XRF > EDXRF > Applications > Research & Development
 
Benchtop Analyzers
Process Analyzers
Benchtop Applications
Process Applications
Accessories
Technology

Energy dispersive X-ray fluorescence (EDXRF) is a routinely used analytical technique for the qualitative and quantitative determina­tion of major and minor atomic elements in a wide variety of sample types. The heart of its versatility stems from the ability to provide rapid, non-destructive, multi-element analyses—from low parts-per-million (ppm) levels to high weight percent (wt%) concentrations—for elements from sodium (11Na) to uranium (92U).

X-ray Transmission (XRT) on-line process analyzers are routinely employed to classify crude oil and marine bunker fuels that contain 0.02-6 wt% sulfur (S). In this method, sulfur absorbs X-rays transmitted between an X-ray source and detector. The technique is well suited to the high pressures and extreme temperatures employed in transmission pipelines and blending operations.
   

Research & Development

Qualitative and Quantitative Elemental Analysis without Standards



Governments and industry collectively invest billions of dollars every year into the research and development of new and advanced materials. This work involves study of the characteristics and uses of various substances, such as metals, ceramics, and plastics, that are employed in applications ranging from aerospace and defense technology to consumer products. Energy Dispersive X-ray fluorescence (EDXRF) is a primary non-destructive technique for the study of such materials, with applications ranging from solids and alloys to liquids, powders and thin films.

Semiquantitative elemental analysis without standards 

The Rigaku NEX CG EDXRF is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards—and rigorous quantitative analysis with standards. Featuring Rigaku's famous Scatter FP method, the software can automatically estimate the concentration of unobserved low atomic number elements (H to F) and provide appropriate corrections.

RPF-SQX greatly reduces the number of required standards, for a given level of calibration fit, as compared to conventional EDXRF analytical software. As standards are expensive, and can be difficult to obtain for newly developed materials, the utility of having a NEX CG spectrometer can significantly lower costs and reduce workload requirements for routine elemental analysis needs.

Research and development information and resources