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Rigaku Journal

The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis community in general, and to serve Rigaku instrumentation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.

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The Rigaku Journal Volume 20 No. 2/December 2003

Contents	Author	Bytes
X-ray Diffraction Patterns of Two Semiconducting Clathrates, Sr₈Ga₁₆Ge₃₀ and Cs₈Na₁₆Ge₁₃₆: Promising Candidates For Thermoelectric Applications	James A. Kaduk, Winnie Wong-Ng, and George S. Nolas	754726
New Approach to Eliminate the Instrumental Aberrations From Powder X-ray Diffraction Data Based on a Fourier Method	Takashi Ida	634565
Simple X-ray Dark- and Bright-field Imaging Using Achromatic Laue Optics	Masami Ando, Anton Maksimenko, Hiroshi Sugiyama, Wanwisa Pattanasiriwisawa, Kazuyuki Hyodo and Chikao Uyama	719819
Microanalysis With a Polycapillary in a Vacuum Chamber	Christina Streli, Natalia Marosi, Peter Wobrauschek and Barbara Frank	2034614
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The Simultaneous Measuring Instrument for X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC)	P. Pianetta, A. Singh, K. Luening, S. Brennan, T. Homma, N. Kubo and M. Watanabe	801062

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