Rigaku Journal
An International Journal of X-ray Characterization
The following issues of the Rigaku Journal are not available on-line:
| Preface | A. Guinier | 1 |
| Contributed Papers | ||
| Diffuse Scattering and Disorder in Crystals | H. Boysen, F. Frey and H. Jagodzinski | 3 |
|
The Problem of Phase Ambiguity in Single Crystal Structure Analysis |
Fan Hai-Fu | 15 |
| Product Information | ||
| Thin Film X-ray Diffractometer | 22 | |
| EXAFS Spectrometer with a Bent Crystal | 24 | |
| Preface | M. M. Woolfson | 1 |
| Contributed Papers | ||
| X-ray Microdiffraction in Bio-medical Studies | J. M. Very | 2 |
|
X-ray Investigations on the Surface Residual Stresses Produced by Hydrogen Diffusion in a Plain Low Carbon Steel |
B. Pathiraj and R. Vasudevan | 4 |
| Product Information | ||
|
Rigaku Single Crystal X-ray Diffractometer for Structure Analysis |
11 | |
| Preface | C.N.R. Rao | 1 |
| Contributed Papers | ||
| Microbeam X-ray Diffraction and Its Applications in the Semiconductor Industry: A 15 Year Retrospective | P. W. DeHaven, C. C. Goldsmith, and T. L. Nunes | 2 |
| Applications of HAUP Method to Studies of Phase Transitions | J. Kobayashi | 11 |
| Ultra-Small-Angle X-ray Scattering | H. Matsuoka, K. Kakigami and N. Ise | 21 |
| Technical Note | ||
| Thin Film X-ray Diffractometry | H. Araki | 29 |
| Product Information | ||
| High Temperature X-ray Diffractometer Attachment Series | 35 | |
| High Precision Fully Automated Piezo Goniometer | 38 | |
| High Sensitivity Type Total Reflection X-ray Spectrometer System 3726 -Wafer Surface Analysis System | 40 | |
| Preface | ||
| The Progress in Crystal Structure Determination over the Last Forty Years: a Memoir by a Man who Tried to Eliminate His Specialty | Yoshi Okaya | 1
|
| Contributed Papers | ||
| Relationship between Cutting Performance and Residual Stress of PVD Coated Film on Cemented Carbide Tool | I. Yazaki, M. Kohata, and K. Sasaki | 6 |
| An Advanced Technique of X-ray Diffractometry for
in Situ Observation at High Temperatures -Application for Intermetallic Compounds |
M. Kimura | 12 |
| Technical Note | ||
| Advanced X-ray Diffractometer and Application to
Petrochemical Products -Measurement of Polymer Compounds by X-ray Diffractometry |
G. Fujinawa | 17 |
| Product Information | ||
| USASG-1 Ultra-small-angle X-ray Scattering Study: Preliminary Experiments of Colloidal Suspensions | 22 | |
| 10" Topography Imaging System | 25 | |
| Fully Automatic Double Crystal X-ray Diffractometer "ADOX" | 29 | |
| Mercury Monitor EMP-1 for Working Environment | 32 | |
| Preface | Krishan Lal | 1 |
| Contributed Papers | ||
| Syntheses, Properties, and X-ray Crystal Structures of "Fantastic" Molecules with High Distortions | C. Kabuto, K. Ebata, A. Sekiguchi and H. Sakurai | 3 |
| Production Control of Portland Cement Manufacturing Process by X-ray Fluorescence | B. D. Wheeler | 15 |
| Determination of Multielement in Manganese Nodules on Board Using X-ray Fluorescence Spectrometry | W. Yimin, L. Guoli and T. Yunye | 25 |
| Technical Note | ||
| Instrumentation and Applications of Total Reflection Fluorescent X-ray Spectrometry | Rigaku Industrial Corporation | 29 |
| Product Information | ||
| Multi-purpose X-ray Diffractometer | 37 | |
| Crystal Collimator-equipped High-resolution X-ray Diffractometer SLX-1 HRD | 44 | |
| X-ray Flat Plane Orientation Measuring Unit for Silicon Ingots | 49 | |
| Fully Automated X-ray Spectrometer System RIX 3000 | 51 | |
| Preface | R. Jenkins | 1 |
| Contributed Papers | ||
| Diffuse Scattering from Crystals of Yeast Initiator TRNA | A. R. Kolatkar, J. B. Clarage, and G. N. Phillips. Jr. | 4 |
| Ceramic Wear Track Characterization by Advanced X-ray diffraction | M. Woydt, A. Skopp and H. Hantsche | 9 |
| Accurate Measurement of Unit-Cell Parameters by the Powder Diffraction Method: The Use of Symmetric Experimental Profile and a New Algorithm for Systematic Error Correction | H. Toraya | 17 |
| Structural Analysis of Semiconductor Superlattices | Y. Kitano, K. Okada, and Y. Mori | 26 |
| Technical Note | ||
| R-AXIS IID: a Two-Dimensional Detector System Using Imaging Plate | K. Sasaki | 33 |
| Product Information | ||
| Automated X-ray Single Crystal Diffractometer AFC-7 Series | 41 | |
| teXsan Structure Analysis Software | 46 | |
| X-ray Spectrometer RIX1000 | 50 | |
| Rapid Measurement System for Single Crystal Orientation RASCO-L | 55 | |
| Preface | H. M. Kanare | 1 |
| Contributed Papers | ||
| Quantitative X-ray Diffraction from Thin Films | I. K. Schuller and Y. Bruynseraede | 3 |
| Combining Molecular Mechanics and X-ray Diffraction Methods | C. L. Day and R. A. Jacobson | 9 |
| The Monomeric Form of Photosystem I Reaction Center of the Thermophilic Cyanobacterium Mastigocladus laminosus: Recent Progress in Crystallization of the Complex | T. Gilon, B. Shaanan and R. Nechushtai | 14 |
| A High-Speed Data-Collection System (R-AXIS IIC) for Large-Unit-Cell Crystals Using an Imaging Plate as a Detector and a Rotating-Anode as X-ray Source | M. Sato | 20 |
| Research Concerning Elimination of Mercury in Flue Gases Using a Filter Layer | M. Takaoka | 36 |
| Product Information | ||
| New Automatic X-ray Diffractometer System D/MAX-2000 Series | 45 | |
| Theta/Theta Goniometer System with a Rotating Anode X-ray Source (TTR) | 50 | |
| Time-Sharing X-ray Imaging System R-AXIS DS | 54 | |
| Fully Automated X-ray Spectrometer RIX2000 | 56 | |
| Preface | S. Tanaka | 1 |
| Contributed Papers | ||
| X-ray Polycrystalline Diffraction Analysis of Thin Films | T. C. Huang | 3 |
| Applications of X-ray Fluorescence-Pattern Recognition in Forensic Archaeometry and Archaeomaterials Analyses | N. W. Bower, J. O. Speare, and W. J. Thomas | 10 |
| Dynamic Deformation Densites and Their Chemical Interpretation | T. S. Cameron, P. K. Bakshi, B. Borecka, and W. Kwiatkowski | 22 |
| X-ray Residual Stress Measurement in Micro Areas of Ceramics | N. Fujii and S. Kozaki | 31 |
| Product Information | ||
| Wide Angle Goniometer "ULTIMA" System | 39 | |
| EXAFS 3000 - A Spectrometer for Extended X-ray Absorption Fine Structure (with a horizontally held sample) | 45 | |
| R-AXIS II -Options and Accessories | 51 | |
| Preface | A. Clearfield | 1 |
| Contributed Papers | ||
| A Practical Approach to Data Collection Using the R-AXIS II | J. Tanner and K. L. Krause | 4 |
| Automated Stress Mapping Using a Microbeam Diffractometer | P. W. DeHaven | 11 |
| Advances in PC Software for XRD | Q. Johnson | 18 |
| Mesomorphic Investigation of Some Tolane-Based Side-Chain Liquid Crystalline Polymers | Ging-Ho Hsiue, Chang-Jyh Hsieh and Ru-Jong Jeng | 22 |
| Development of Total Reflection X-Ray Diffractometer for Structural Analysis of Ultra-thin Films by Laue Method | T. Horiuchi and K. Matsushige | 30 |
| Technical Note | ||
| Quantitative Analysis of Rock Samples by an X-ray Fluorescence Spectrometer (1) | 40 | |
| Product Information | ||
| Imaging Plate Diff ractometer for Small Molecule Applications R-AXIS CS | 60 | |
| Multichannel Simultaneous X-ray Spectrometer Systems "Simultix 10", "Simultix 11" | 64 | |
| Preface | J. V Gilfrich | 1 |
| Contributed Papers | ||
| Small Molecule Diffraction Studies with the R-AXIS Area Detector -Structural Aspects of a Class of Urea Inclusion Compounds | M. E. Brown, M. D. Hollingsworth and B. D. Santarsiero | 4 |
| Residual Stress in Ion Implanted Titanium Nitride Studied by Parallel Beam Glancing Incidence X-ray Diffraction | D. E. Geist, A. J. Perry, J. R. Treglio, V. Valvoda and D. Rafaja | 9 |
| A Suggestion for Use of Ultrashort Wavelength X-rays -A Report on Development and Testing of a High-Resolution Analytical System for Electron Density Distribution | F. P. Okamura | 15 |
| Imaging of Diffraction Data by the Maximum Entropy Method -A New Approach To Crystallography | M. Sakata | 22 |
| Technical Note | ||
| An Introduction to X-ray Absorption Fine Structure | Y. Udagawa | 30 |
| Product Information | ||
| X-ray Microdiffractometer PSPC/MDG 2000 | 39 | |
| High Sensitivity Total Reflection X-ray Spectrometer System 3700 | 44 | |
| The Apparatus Used for Measuring Mercury in the Fluorescent Lamp of the Liquid Crystal Display Mercury/TM-2 | 49 | |